International journal of Nano Scientific Networks and Nanotechnology (IJNN) is a multidisciplinary, peer reviewed journal which includes all the major fields in nanotechnology and Nano science. Nanoscience and nanotechnology brought up an unprecedented excitement in the scientific and engineering communities, especially the last decade. It is the engineering of functional systems at the molecular scale. This covers both current work and concepts that are more advanced.  International journal of Nano Scientific Networks and Nanotechnology   publishes original research papers during a broad area of nanoscience & engineering. IJNN provides an ideal forum for presenting original reports of theoretical and experimental nanoscience and nanotechnology research. Nanotechnology is a gathering of rising innovations in which the structure of matter is controlled at the nanometer scale, the size of little quantities of molecules, to create novel materials and gadgets that have valuable and one of kind properties. IJNN is naturally multidisciplinary, and welcomes submissions across biological, physical, engineering, and computer sciences. Contributions from both academia and industry are equally encouraged. IJNN also publishes innovative techniques and instrumentation for the fabrication, characterization and testing of nano-enabled devices and technologies, as well as advanced modelling and simulation methods.


committee

Members

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Tanuj Kumar

Assistant Professor

 

 

  • Simulation -Numerical Simulation of origin of nanostructures on semiconductor surface.
  • SchottkyDiodes-Study of fabrication and electrical properties of GaN, Si diodes using DLTS, STM.
  • Synthesis of nanostructures-Study the surface morphology using Atomic force microscopy to understand the basic understanding of physics in synthesis of self-organisednanostructures by ion beam irradiation of semiconductors.
  • Ion Beam-Modification of material properties using energetic ion beams and generation of ordered surface based nano and microstructures using ion beam.
  • Growth of semiconductors-Structural evolution in Si, Ge s.t. defects generation and annihilation, re-crystallization, with Swift Heavy Ion (SHI) beam.

 

  • Plasmonics and Photo-catalytic activity-Study the fabrication of plasmonic surface and their photo-catalytic actives
  • X-ray techniques -Interesting to use of X-ray techniques in condensed matter physics for better understanding of research work
  • Sputtering-Sputtering study on BaF2 and CaF2 thin films

 

  • National Eligibility Test for Junior Research Fellowship (NET/JRF) Conducted by UGC-CSIR, India-Dec.  2008
  • Graduate Aptitude test (GATE)----AIR-102(98.06 percentile) -July   2008
  • State Teachers Eligibility Test (STET)
  • National Cadet Corps (NCC)- “C” Certificate
  • National Cadet Corps (NCC)- “B” Certificate
  • First position in B.Sc. (Govt. College Safidon)
  • 2nd prize in Science Quiz, Kurukshetra University, Kurukshetra
  • Tanuj Kumar, A. Kumar, D. Kanjilal, An approach to tune the amplitude of surface ripple patterns, Appl Phy Lett 103 (2013) 131604. 
    Impact factor: 3.3,Print: ISSN 0003-6951,Online: ISSN 1077-3118
  • Tanuj Kumar, M. Kumar, G. Gupta, R.K. Pandey, S. Verma, D. Kanjilal, Role of surface composition in morphological evolution of GaAs nano-dots with low-energy ion irradiation, Nanoscale Res Lett, 7 (2012) 552.,Impact factor: 2.7,ISSN no.: 1556-276X (electronic version).
  • Tanuj Kumar, S.A. Khan, U.B. Singh, S. Verma, D. Kanjilal, Formation of nanodots on GaAs by 50 keV Ar+ ion irradiation, Appl Surf Sci, 258 (2012) 4148-4151
     Impact factor: 2.7
      ISSN no.: 0169-4332 (electronic version).
  • Tanuj Kumar, M. Kumar, S. Verma, D. Kanjilal, Fabrication of ordered ripple patterns on GaAs (100) surface using 60 keV Ar+ beam irradiation, Surface Engineering 29 (2013) 543.

          Impact factor: 1.1

          Print ISSN: 0267-0844

          Online ISSN: 1743-2944

  • S. Verma, P. Kumsi, T. Kumar, D. Kanjilal, In-situ Investigation of Current Transport across Pt/n-Si (100) Schottky Junction during 100 MeV Ni+ 7 Ion Irradiation, Device and Materials Reliability, 13 (2013) 98.

          Impact factor: 1.516

          ISSN: 1530-4388

  •  Tanuj Kumar, Ashish Kumar, N. P. Lalla,  Sonu Hooda, Sunil Ojha, Shammi Verma, and D. Kanjilal, Role of ion beam induced solid flow in surface patterning of Si (100) using Ar ion, Appl Surf Sci, 283 (2013) 417-421.

          Impact factor: 2.7

           ISSN no.: 0169-4332 (electronic version).

  • Tanuj Kumar, A. Kumar, D.C. Agarwal, N.P. Lalla, D. Kanjilal, Ion beam-generated surface ripples: new insight in the underlying mechanism, Nanoscale Res Lett, 8 (2013) 336, 1-5.

             Impact factor: 2.7

              ISSN no.: 1556-276X (electronic version).

  • Ashish Kumar, Tanuj Kumar, A. Hähnel, D. Kanjilal, R. Singh, Dynamics of modification of Ni/GaN Schottky barrier diodes irradiated at low temperature by 200 MeV Ag14+ ions, Appl Phy Lett., 104 (2014) 033507.

            Impact factor: 3.3

             Print: ISSN 0003-6951

             Online: ISSN 1077-3118

  • M. Kumar, K.K. Parashar, S.K. Tandi, T. Kumar, D.C. Agarwal, A. Pathak, Fabrication of Ag: TiO 2 Nanocomposite Thin Films by Sol-Gel Followed by Electron Beam Physical Vapour Deposition Technique, Journal of Spectroscopy, 2013 (2013) Article ID 491716.

             Impact factor: 0.8

             ISSN: 2314-4920 (Print)

              ISSN: 2314-4939 (Online)

  •  Tanuj Kumar, U.B. Singh,  M. Kumar, Sunil Ojha, S. Verma, D. Kanjilal, Tuning of ripple patterns and wetting dynamics of Si (100) surface using ion beam irradiation, Current Applied Physics 14 (2014) 312-317.

          Impact factor: 2.2

         ISSN: ISSN: 1567-1739.

  • Ratnesh K. Pandey, Manvendra Kumar, Saif A. Khan, Tanuj Kumar, Ambuj Tripathi, D. K. Avasthi, Avinash C. Pandey, Study of electronic sputtering in CaF2 thin films, Appl Surf Sci, 289 (2014) 77-80.

         Impact factor: 2.7

           ISSN no.: 0169-4332 (electronic version).

  •  M Kumar, T Kumar, DK Avasthi, Study of thermal annealing induced plasmonic bleaching in Ag:TiO2 nanocomposite thin films, Scripta Materialia 105 (2015) 46-49

          Impact Factor: 3.2

            ISSN: 1359-6462

  • RP Yadav, T Kumar, AK Mittal, S Dwivedi, D Kanjilal, Fractal characterization of the silicon surfaces produced by ion beam irradiation of varying fluences, Applied Surface Science 347 (2015) 706-712

        Impact factor: 2.7

  • Ratnesh K. Pandey, Manvendra Kumar, Tanuj Kumar, Avinash C. Yadav, Udai B. Singh, Saif A. Khan, Ambuj Tripathi, D. K. Avasthi, Dynamic scaling of swift heavy ion induced surface restructuring of BaF2 thin film, Materials Letters 143 (2015) 309-311

           Impact factor: 2.4

            ISSN: 0167-577X

  • S Hooda, B Satpati, S Ojha, T Kumar, D Kanjilal, D Kabiraj, Structural manipulation in Ge by swift heavy ions governed by electron–phonon coupling strength, Materials Research Express 2 (4) (2015) 045903

          ISSN: 2053-1591

  • Tanuj Kumar, Manish Kumar, Vandana Panchal, PK Sahoo, D Kanjilal, Energy-Separated Sequential Irradiation for Ripple Pattern Tailoring on Silicon Surfaces, Applied Surface Science 357 A (2015) 184-188

          Impact factor: 2.7

  •  Sonu Hooda, Biswarup Satpati, Tanuj Kumar, Sunil Ojha, Dinakar Kanjilal, Regrowth of Ge consisting of different degree of damage under thermal and athermal treatment, RSC Advances : 6 (6) (2016) 4576-4586

            Impact factor: 3.84

  • Tanuj Kumar, Vandana Panchal, Ashish Kumar, D Kanjilal, Nano-pits on GaAs (100) surface: Preferential sputtering and diffusion, Nuclear Instruments and Methods in Physics Research Section B, 379 (2016) 52-56
  • RP Yadav, Tanuj Kumar, V Baranwal, Vandana, Manvendra Kumar, PK Priya, SN Pandey, AK Mittal, Journal of Applied Physics, 121(5) (2017) 055301